• Title of article

    Research note Analog circuit fault diagnosis based on noise measurement

  • Author/Authors

    Dai، Yisong نويسنده , , Xu، Jiansheng نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    -1292
  • From page
    1293
  • To page
    0
  • Abstract
    In this paper, an analog circuit fault diagnosis method using a noise measurement and analysis approach is suggested. Compared to the conventional circuit fault diagnosis methods, this method can discover hidden and early circuit fault caused by the device defects. Since circuit fault diagnosis is more difficult than device-defect detection, in this paper the circuit output noise calculation, the comparison between the normal and failure conditions and the circuit fault diagnosis method have been discussed. Finally, an example of an active filter circuit fault diagnosis hasA been given by using this method. © 1999 Elsevier Science Ltd. All rights reserved.
  • Keywords
    GaAs , Plastic packages , Thermo-mechanical , Thermal , Reliability , Chemical , CVD diamond
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Serial Year
    1999
  • Journal title
    MICROELECTRONICS RELIABILITY
  • Record number

    13144