Title of article
Crystal, electronic structure and electronic transport properties of the Ti1−xVxNiSn (х=0–0.10) solid solutions
Author/Authors
Yu. Stadnyk، نويسنده , , A. Horyn’، نويسنده , , V.V. Romaka، نويسنده , , Yu. Gorelenko، نويسنده , , L.P. Romaka، نويسنده , , E.K. Hlil، نويسنده , , D. Fruchart، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
6
From page
3023
To page
3028
Abstract
The n-TiNiSn ternary intermetallic semiconductor is doped by the V donor impurity and the crystalline structure of the obtained Ti1−xVxNiSn solid solutions (х=0–0.10) is determined by X-ray diffraction. Temperature and concentration dependences of the resistivity and thermopower are investigated in 80–380 K range. As main results, the TiNiSn conductivity type is revealed insensitive to V doping and the thermopower factor substantially increases versus V content. First principle calculations based on DFT using FPLO and KKR–CPA methods are performed as well. Experimental data and electronic structure calculations are compared and discussed in terms of thermopower improvements.
Keywords
Electronic structure calculations , Electrical resistivity , Half-Heusler phases , Seebeck coefficient
Journal title
JOURNAL OF SOLID STATE CHEMISTRY
Serial Year
2010
Journal title
JOURNAL OF SOLID STATE CHEMISTRY
Record number
1334711
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