Temperature dependence of deuterium retention mechanisms in tungsten

The retention of 500 eV D+ was measured as a function of implantation temperature in single- (SCW) and poly-crystalline (PCW) tungsten. The results show a decrease in retention of ∼2 orders of magnitude over the temperature range of 350–550 K in SCW and a decrease of an order of magnitude over the temperature range of 600–700 K in PCW. Inspection of the TDS spectra showed a shift in peak location from 600 to 800 K as temperature was increased above 350 K in SCW and above 450 K in PCW specimens. TMAP modeling showed that the change in peak location corresponds to a change in trapping energy from 1.3 eV for the 600 K peak to 2.1 eV for the 800 K peak. It is proposed that for implantations performed above 350 K in SCW and 450 K in PCW, deuterium-containing vacancies are able to diffuse and combine to create stable nano-bubbles within the crystal lattice. The formation of nano-bubbles due to the annihilation of deuterium-vacancy complexes results in a change in the trapping energy from 1.3 to 2.1 eV as well as a decrease in retention as some of the deuterium-vacancy complexes will be destroyed at surfaces or grain boundaries, decreasing the number of trapping sites available.