Scanning probe microscopic investigations of amorphous tellurium subhalides

This work reports on tellurium subhalide surfaces investigated by means of atomic force and scanning tunnelling microscopy (AFM/STM). Characteristic structural features on the submicrometer length scale are presented for amorphous TeCl and Te2Br0.75I0.25 samples. Atomically resolved images show both disordered and periodic structures. Interatomic distances are compared with those of crystalline compounds as well as results of X-ray diffraction measurements. Upon thermal treatment under ultra high vacuum conditions decomposition in competition with recrystallization takes place.