Title of article
Study of the absorption edge of SnO2 nanoparticles embedded in silica films
Author/Authors
Lorenzi، نويسنده , , R. and Lauria، نويسنده , , A. and Mochenova، نويسنده , , N. and Chiodini، نويسنده , , N. and Paleari، نويسنده , , A.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
4
From page
1888
To page
1891
Abstract
Silica thin films with embedded SnO2 nanoparticles have been grown on transparent substrates by the sol–gel method. Tin dioxide crystals with cassiterite structure are semiconductors with a wide band gap of ~ 3.6 eV. Optical absorption spectroscopy in the near ultraviolet–visible range has been exploited to probe nanostructuring features of such nanocrystals. The results show that the sintering conditions modify crystallite mean size and enable the occurrence of quantum confinement effects. The outcome is in accordance with transmission electron microscopy data conducted on analogous bulk samples.
Keywords
Silica film , Wide band gap semiconductor , Sol–gel , Nanostructures , Absorption edge
Journal title
Journal of Non-Crystalline Solids
Serial Year
2011
Journal title
Journal of Non-Crystalline Solids
Record number
1380663
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