• Title of article

    Study of the absorption edge of SnO2 nanoparticles embedded in silica films

  • Author/Authors

    Lorenzi، نويسنده , , R. and Lauria، نويسنده , , A. and Mochenova، نويسنده , , N. and Chiodini، نويسنده , , N. and Paleari، نويسنده , , A.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    4
  • From page
    1888
  • To page
    1891
  • Abstract
    Silica thin films with embedded SnO2 nanoparticles have been grown on transparent substrates by the sol–gel method. Tin dioxide crystals with cassiterite structure are semiconductors with a wide band gap of ~ 3.6 eV. Optical absorption spectroscopy in the near ultraviolet–visible range has been exploited to probe nanostructuring features of such nanocrystals. The results show that the sintering conditions modify crystallite mean size and enable the occurrence of quantum confinement effects. The outcome is in accordance with transmission electron microscopy data conducted on analogous bulk samples.
  • Keywords
    Silica film , Wide band gap semiconductor , Sol–gel , Nanostructures , Absorption edge
  • Journal title
    Journal of Non-Crystalline Solids
  • Serial Year
    2011
  • Journal title
    Journal of Non-Crystalline Solids
  • Record number

    1380663