• Title of article

    Glasses for lithography

  • Author/Authors

    Jain، نويسنده , , H. and Vlcek، نويسنده , , M.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    6
  • From page
    1401
  • To page
    1406
  • Abstract
    The highest resolution in a lithographic process is often determined by the properties of the resist material. With the currently used polymeric resists, a resolution of better than 100 nm has been achieved under manufacturing conditions, but the future nanoscale devices will require a 10 times superior resolution. In this paper we present an overview of the resist materials, especially with regard to limiting resolution. In principle, inorganic resists should have higher limiting resolution than polymer resists due to smaller fundamental structural units and stronger bonds in the former. However, compositional and/or structural inhomogeneities may limit their ultimate resolution. New results are presented that indicate chalcogenide glasses as promising photo and electron beam resists, which also have the advantages of greater hardness, resistance to acids, easy fabrication in thin film form, and the unique phenomena like radiation enhanced diffusion.
  • Keywords
    chalcogenides , Photoinduced effects
  • Journal title
    Journal of Non-Crystalline Solids
  • Serial Year
    2008
  • Journal title
    Journal of Non-Crystalline Solids
  • Record number

    1382697