Title of article
A novel artifact for testing large coordinate measuring machines
Author/Authors
Phillips، نويسنده , , S.D and Sawyer، نويسنده , , D and Borchardt، نويسنده , , B and Ward، نويسنده , , D and Beutel، نويسنده , , D.E، نويسنده ,
Issue Information
فصلنامه با شماره پیاپی سال 2001
Pages
6
From page
29
To page
34
Abstract
We present a high-accuracy artifact useful for the evaluation of large CMMs. This artifact can be physically probed by the CMM in contrast to conventional techniques that use such purely optical methods as laser interferometers. The system can be used over large distances; for example, over 4 meters, with an uncertainty of less than one part per million. The artifact is relatively inexpensive, robust for use in reasonable industrial environments, and significantly reduces testing time over traditional step gauge measurements.
Keywords
CMM , Interferometer , Error , Performance Evaluation , Retroreflector
Journal title
Precision Engineering
Serial Year
2001
Journal title
Precision Engineering
Record number
1428629
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