Title of article
Overview on SiN surface passivation of crystalline silicon solar cells
Author/Authors
Aberle، نويسنده , , Armin G، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
10
From page
239
To page
248
Abstract
Silicon nitride (SiN) fabricated by plasma-enhanced chemical vapour deposition (PECVD) is increasingly used within the crystalline silicon (c-Si) photovoltaic industry as it offers the possibility to fabricate a surface and bulk passivating antireflection coating at low temperature (⩽450°C). This article presents an overview on the present status of SiN for industrial as well as laboratory-type c-Si solar cells. Topics covered include the fundamentals of the PECVD technology, the present status of high-throughput PECVD machines for the deposition of SiN onto c-Si wafers, and a review of the fundamental properties of Si–SiN interfaces fabricated by PECVD.
Keywords
Photovoltaics , Silicon solar cells , Silicon nitride , Surface passivation , PECVD
Journal title
Solar Energy Materials and Solar Cells
Serial Year
2001
Journal title
Solar Energy Materials and Solar Cells
Record number
1476782
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