Characterisation of light trapping in silicon films by spectral photoconductance measurements

This paper presents progress made in developing a method of measuring light trapping intrinsically free of uncertainties associated with reflector absorption and collection losses. These problems presently restrict analysis to uniformly absorbed wavelengths, which in thin films especially accounts for only a minor part of available light trapping benefit. We aim to extend photoconductance measurements, which presently are also similarly restricted, to nonuniformly absorbed wavelengths in order to fully characterise light trapping. Specimen preparation and measurement guidelines are given.