Title of article
Thin film GaAs solar cells with increased quantum efficiency due to light reflection
Author/Authors
Bauhuis، نويسنده , , G.J. and Schermer، نويسنده , , J.J. and Mulder، نويسنده , , P. and Voncken، نويسنده , , M.M.A.J. and Larsen، نويسنده , , P.K.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
10
From page
81
To page
90
Abstract
Thin film GaAs solar cells, separated from their substrate using the weight-induced epitaxial lift-off technique, were compared with conventional cells on a substrate. The thin film cells can be illuminated from both sides using a mirror. The thickness of the p-type GaAs layer, which is the base layer for front illumination and the emitter layer for rear illumination, was varied between 0.25 and 2.5 μm. For both front and rear illumination, the cell efficiency shows a maximum at a thickness of 1.5 μm. The rear illuminated cell current is only 10% lower than for front illumination. Light reflection in the thin film cell enhances the external quantum efficiency and the collection efficiency in the higher wavelength region from 0.84 to 0.90 and from 0.82 to 0.95, respectively.
Keywords
Epitaxial lift-off , Thin film , GaAs solar cell
Journal title
Solar Energy Materials and Solar Cells
Serial Year
2004
Journal title
Solar Energy Materials and Solar Cells
Record number
1479284
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