• Title of article

    Unit root tests with a break in innovation variance

  • Author/Authors

    Kim، نويسنده , , Tae-Hwan and Leybourne، نويسنده , , Stephen C. Newbold، نويسنده , , Paul، نويسنده ,

  • Issue Information
    دوفصلنامه با شماره پیاپی سال 2002
  • Pages
    23
  • From page
    365
  • To page
    387
  • Abstract
    It is shown that an abrupt change in the innovation variance of an integrated process can generate spurious rejections of the unit root null hypothesis in routine applications of Dickey–Fuller tests. We develop and investigate modified test statistics, based on unit root tests of Perron for a time series with a changing level, or changing intercept and slope, which are applicable when there is a change in innovation variance of an unknown magnitude at an unknown location.
  • Keywords
    Dickey–Fuller tests , Perron tests , Integrated processes , Structural break
  • Journal title
    Journal of Econometrics
  • Serial Year
    2002
  • Journal title
    Journal of Econometrics
  • Record number

    1558207