• Title of article

    On transient Bessel processes and planar Brownian motion reflected at their future infima

  • Author/Authors

    Shi، نويسنده , , Z.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1995
  • Pages
    16
  • From page
    87
  • To page
    102
  • Abstract
    Let R be a transient Bessel process and let J(t) = infu≥t R(u) be its future infimum process. The main result of this paper is an integral test characterizing the upper functions of R – J, which turn out to be quite different from those of R. The test implies in particular an iterated logarithm law recently obtained by Khoshnevisan et al. (1994), and also solves the problem of characterizing the large gaps between the past supremum and future infimum of R. The corresponding local question for a planar Wiener process is studied.
  • Keywords
    60J65 , 60G17 , Future infimum , Bessel gap , Wiener Process , Integral test
  • Journal title
    Stochastic Processes and their Applications
  • Serial Year
    1995
  • Journal title
    Stochastic Processes and their Applications
  • Record number

    1575794