Title of article
On transient Bessel processes and planar Brownian motion reflected at their future infima
Author/Authors
Shi، نويسنده , , Z.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
16
From page
87
To page
102
Abstract
Let R be a transient Bessel process and let J(t) = infu≥t R(u) be its future infimum process. The main result of this paper is an integral test characterizing the upper functions of R – J, which turn out to be quite different from those of R. The test implies in particular an iterated logarithm law recently obtained by Khoshnevisan et al. (1994), and also solves the problem of characterizing the large gaps between the past supremum and future infimum of R. The corresponding local question for a planar Wiener process is studied.
Keywords
60J65 , 60G17 , Future infimum , Bessel gap , Wiener Process , Integral test
Journal title
Stochastic Processes and their Applications
Serial Year
1995
Journal title
Stochastic Processes and their Applications
Record number
1575794
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