• Title of article

    Electrodissolution of Ti and p-Si in acidic fluoride media: formation ratio of oxide layers from electrochemical impedance spectroscopy

  • Author/Authors

    I. Frateur، نويسنده , , Isabelle and Cattarin، نويسنده , , Sandro and Musiani، نويسنده , , Marco and Tribollet، نويسنده , , Bernard، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    9
  • From page
    202
  • To page
    210
  • Abstract
    The electrodissolution of Ti and p-Si electrodes in acidic fluoride solutions has been investigated by electrochemical impedance spectroscopy as a function of potential E, fluoride concentration, pH and angular speed of the electrode, with the aim of characterising the oxide layers covering both materials. The impedance diagrams have been analysed to obtain the low frequency capacitance Clf, the high frequency capacitance Chf and the product RhfI (where Rhf is the high frequency resistance and I the steady-state current). In the potential domain where the oxide thickness x is proportional to E, the formation ratio dx/dE has been computed from Clf, Chf and RhfI. The calculated values have been found to be in good mutual agreement and close to the ones found in the literature.
  • Keywords
    Electropolishing , resistance , SiO2 , Hydrofluoric acid , capacitance , TIO2
  • Journal title
    Journal of Electroanalytical Chemistry
  • Serial Year
    2000
  • Journal title
    Journal of Electroanalytical Chemistry
  • Record number

    1667278