Title of article
Interfacial electronic states and magnetoresistance in tunnel junctions
Author/Authors
Itoh، نويسنده , , Hiroyoshi and Inoue، نويسنده , , Jun-ichiro، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
9
From page
748
To page
756
Abstract
The relation between the tunnel magnetoresistance (TMR) and the spin polarization (P) of ferromagnetic tunnel junctions (FTJ) is investigated, focusing on the effect of electronic states at interfaces of FTJ. We calculate the electronic states of transition-metal (TM)/Al2O3 interfaces, and show that the presence of imperfectly oxidized Al or O ions at the interface gives rise to positive P values due to spin-dependent s–d or p–d mixing at the interface. Model calculations of the tunnel conductance and TMR reveal that the presence of a few imperfectly oxidized ions at the interfaces govern the tunnel conductance, and the P of these ions is correlated with the TMR. The presence of imperfectly oxidized Al or O ions at the TM/Al2O3 interfaces can well account for the TMR observed in TM/Al2O3/TM and TM/Al2O3/La–SrMnO3 junctions.
Keywords
etc.) , Interface states , Magnetic phenomena (cyclotron resonance , Phase transitions , Tunneling
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1678317
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