• Title of article

    Step rearrangement on Si(001) surface during diborane exposure

  • Author/Authors

    Fujita، نويسنده , , Ken-ichiro Ichikawa، نويسنده , , Masakazu، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    7
  • From page
    85
  • To page
    91
  • Abstract
    We observed step rearrangement on Si(001) surface during B adsorption by using scanning tunneling microscopy. The coverage of B atoms was varied by exposing the surface to diborane during observation. Our results showed that B atoms adsorbed on Si(001) are responsible for the step rearrangement. Variation of the terrace size was analyzed as a function of diborane dose. Comparing our results with previous reports, we ascribed the dominant factor in terrace narrowing during B adsorption to the reduction of the energies to create SA steps.
  • Keywords
    boron , Silicon , Step formation and bunching , Stepped single crystal surfaces , Scanning tunneling microscopy
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1679653