Title of article
Ab initio temperature dependent studies of the homoepitaxial growth on Si(0 0 1) surface
Author/Authors
Da?، نويسنده , , S. and Ciraci، نويسنده , , S. and K?l?ç، نويسنده , , C. and Fong، نويسنده , , C.Y.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
12
From page
109
To page
120
Abstract
We performed ab initio zero temperature and finite temperature molecular dynamics calculations to investigate the homoepitaxial growth on the Si(0 0 1) surface. How do the deposited atoms (adatoms) form addimers and how do the addimers reach their favorable positions at the nucleation site of the growth process are presented. Once two epitaxial addimers, one over the dimer row and oriented perpendicular to the surface dimer bonds and the other over the adjacent trough, are aligned at high temperature, the nucleation site of the growth process is formed. The concerted bond exchange between these addimers and the reconstructed surface dimers is found to be the atomistic mechanism that leads to the homoepitaxial growth.
Keywords
epitaxy , Molecular dynamics , surface structure , Growth , Silicon , Adsorption kinetics , Density functional calculations , and topography , morphology , Roughness
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1680188
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