X-ray absorption near edge spectroscopy from reflection x-ray absorption fine structure under the grazing incidence conditions

XANES spectra, equivalent to β-XAFS, are extracted from reflection X-ray absorption fine structure (ReflXAFS) spectra for several thin films such as TiSi2 and Sb-Te alloys, by use of the Kramers-Kroning relations recursively. The extraction is based on the interpretation that a ReflXAFS spectrum, observed as a superposition of β-XAFS and δ-XAFS, is an extension of the Fresnel reflectivity into the energy space.