Title of article
Photoemission investigations of manganese thin films deposited on GeS(0 0 1) surfaces
Author/Authors
Mirabella، نويسنده , , F. and Johnson، نويسنده , , R.L. and Ghijsen، نويسنده , , J.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2002
Pages
11
From page
172
To page
182
Abstract
Manganese thin films have been deposited on GeS(0 0 1) cleaved surface. The growth mode, chemical states and Mn 3d density of state (DOS) have been investigated by X-ray and synchrotron radiation photoelectron spectroscopy. Out of these measurements we propose a film model where Mn clusters nucleate on a three-monolayer thick MnS2+Ge interface. Mn 3d DOS and satellite structure of Mn core levels indicate that p–d hybridization is weaker at the Mn/GeS interface than in bulk compound where manganese is covalently bonded.
Keywords
sulphides , Photoemission (total yield) , Metal–semiconductor interfaces , X-ray photoelectron spectroscopy , Synchrotron radiation photoelectron spectroscopy , Manganese
Journal title
Surface Science
Serial Year
2002
Journal title
Surface Science
Record number
1681169
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