Title of article
Sulfur edge XANES and XPS spectroscopy of ethanethiol adsorbed on nickel
Author/Authors
Syed، نويسنده , , J.A. and Sardar، نويسنده , , S.A. and Yagi، نويسنده , , S. and Tanaka، نويسنده , , K.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
6
From page
597
To page
602
Abstract
For the interaction of ethanethiol (C2H5SH) with the Ni(1 1 0) surface, we utilize X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge spectroscopy (XANES) measurements to identify the adsorbed sulfur species and their orientation on the surface at low temperature. Upon adsorption on the Ni(1 1 0) surface, ethanethiolate as well as atomic sulfur is formed. For the ethanethiolate, the S–C bond is found predominantly perpendicular to the substrate as revealed by polarization analysis. A qualitative estimation of charge transfer from substrate to molecule is carried out with the aid of S 1s XPS measurements.
Keywords
etc.) , Mobility , X-ray absorption spectroscopy , X-ray photoelectron spectroscopy , nickel , Electrical transport (conductivity , resistivity , Sulphur
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1682096
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