Title of article
Growth of thin Bi films on W(1 1 0)
Author/Authors
Koitzsch، نويسنده , , C. and Bovet، نويسنده , , M. and Clerc، نويسنده , , F. and Naumovi?، نويسنده , , D. and Schlapbach، نويسنده , , L. and Aebi، نويسنده , , P.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2003
Pages
6
From page
51
To page
56
Abstract
We report on the growth of single crystalline epitaxial Bi films on W(1 1 0). X-ray photoelectron diffraction (XPD) and low energy electron diffraction (LEED) reveal that Bi grows well ordered in the pseudocubic (0 0 1) orientation. The two-fold symmetric W(1 1 0) surface supports four different Bi(0 0 1) domains. The multi-domain nature is unambigously detected via LEED showing a peculiar splitting of spots. It is shown that a preferential domain alignment along the [0 0 1]tungsten-direction accounts for this observation and is in agreement with a two-fold XPD pattern.
Keywords
Low energy electron diffraction (LEED) , Photoelectron diffraction measurement , GROWTH , Tungsten , Bismuth
Journal title
Surface Science
Serial Year
2003
Journal title
Surface Science
Record number
1682989
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