Title of article
Fully polarization resolved X-ray absorption spectroscopy of C2H4 on single-domain Si(0 0 1)-(2 × 1)
Author/Authors
Hennies، نويسنده , , Franz and Fِhlisch، نويسنده , , Alexander and Wurth، نويسنده , , Wilfried and Witkowski، نويسنده , , Nadine and Nagasono، نويسنده , , Mitsuru and Novella Piancastelli، نويسنده , , Maria، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2003
Pages
7
From page
144
To page
150
Abstract
We present a polarization resolved near edge X-ray absorption fine structure (NEXAFS) investigation of ethylene (C2H4) adsorbed on the oriented single-domain Si(0 0 1)-(2 × 1) surface.
he detected resonances and their polarization dependences C2H4 is found to be strongly bound to the silicon dimers with the carbon atoms in a sp3-hybridized state. The molecular axis is rotated around the surface normal with respect to the dimer axis.
Keywords
alkenes , Chemisorption , Silicon , X-ray absorption spectroscopy
Journal title
Surface Science
Serial Year
2003
Journal title
Surface Science
Record number
1683203
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