Title of article
Electron-spectroscopy and -diffraction study of the conductivity of CVD diamond (0 0 1)2×1 surface
Author/Authors
Kono، نويسنده , , S. and Takano، نويسنده , , Jonathan T. Pierce-Shimomura، نويسنده , , M. and Goto، نويسنده , , T. and Sato، نويسنده , , K. and Abukawa، نويسنده , , T. and Tachiki، نويسنده , , M. and Kawarada، نويسنده , , H.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2003
Pages
9
From page
180
To page
188
Abstract
A chemical vapor deposition as-grown diamond (0 0 1) single-domain 2 × 1 surface was studied by electron-spectroscopy and electron-diffraction in ultrahigh vacuum (UHV). In order to change the surface conductivity (SC) of the diamond in UHV, three annealing stages were used; without annealing, annealing at 300 °C and annealing at 550 °C. From low energy electron diffraction and X-ray photoelectron spectroscopic (XPS) studies, an existence of SC was suggested for the first two stages of annealing and an absence of SC was suggested for the last stage of annealing. Changes in C KVV Auger electron spectroscopic spectra, C KVV Auger electron diffraction (AED) patterns and C 1s XPS peak positions were noticed between the annealing stages at 300 and 550 °C. These changes are interpreted as such that the state of hydrogen involvement in a subsurface of diamond (0 0 1)2 × 1 changes as SC changes. In particular, the presence of local disorder in diamond configuration in SC subsurface is pointed out from C KVV AED. From C 1s XPS peak shifts, a lower bound for the Fermi-level for SC layers from the valence band top is presented to be ∼0.5 eV.
Keywords
Surface electrical transport (surface conductivity , surface recombination , etc.) , Auger electron diffraction , Auger electron spectroscopy , X-ray photoelectron spectroscopy , chemical vapor deposition , diamond
Journal title
Surface Science
Serial Year
2003
Journal title
Surface Science
Record number
1683222
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