Title of article
Fabrication and optical characterization of a TiO2 thin film on a silica microsphere
Author/Authors
Haraguchi، نويسنده , , M. and Komatsu، نويسنده , , F. and Tajiri، نويسنده , , K. and Okamoto، نويسنده , , T. and Fukui، نويسنده , , M. and Kato، نويسنده , , S.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
8
From page
59
To page
66
Abstract
We have fabricated a uniform TiO2 thin film on a silica microsphere by using the so-called sol–gel reaction. Characterization of the TiO2 thin film was carried out by scanning electron microscopy, Raman scattering, and the attenuated-total-reflection (ATR) method. We have observed optical resonances of microspheres with and without the TiO2 thin film by using the ATR method, which allowed us to evaluate optically the thickness and the refractive index of the TiO2 thin film from the resonance due to excited whispering gallery modes, which are resonance modes inherent of microspheres.
Keywords
Raman scattering spectroscopy , Titanium oxide , Reflection spectroscopy , Silicon oxides , Scanning electron microscopy (SEM) , Coatings
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1684115
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