Title of article
Growth of atomically flat Ag on mica
Author/Authors
Dumont، نويسنده , , J. and Wiame، نويسنده , , F. and Ghijsen، نويسنده , , J. and Sporken، نويسنده , , R.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
8
From page
459
To page
466
Abstract
We investigated, by Scanning Tunneling Microscopy, the influence of the deposition rate on the morphology of Ag films grown on mica heated around 475 K. An explanation of growth morphologies based on mean-field nucleation theory and on the theory of Tersoff, Denier and Tromp is proposed. Two-dimensional growth is obtained if the Ag flux is adjusted in a way that reduces the difference between the diffusion lengths of Ag on Ag and of Ag on mica: it helps to minimise the density of islands in order to avoid the piling-up that arises from a high step-edge diffusion barrier. This is achieved by keeping the substrate around 475 K during deposition.
Keywords
surface structure , Metallic films , and topography , Mica , morphology , Roughness , silver , epitaxy , Scanning tunneling microscopy
Journal title
Surface Science
Serial Year
2004
Journal title
Surface Science
Record number
1684956
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