• Title of article

    The deposition of Fe or Co clusters on Cu substrate by molecular dynamic simulation

  • Author/Authors

    Hong، نويسنده , , Zheng-Han and Hwang، نويسنده , , Shun-Fa and Fang، نويسنده , , Te-Hua، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2011
  • Pages
    8
  • From page
    46
  • To page
    53
  • Abstract
    A molecular dynamic method is used to simulate the film growth process of Fe or Co clusters depositing on Cu substrate with low energy. The tight-binding (TB-SMA) many-body potential is used to simulate the interaction between atoms. The effects of different incident energies and/or substrate temperatures on the surface roughness, layer coverage function, radial distribution function (RDF), and residual stress are investigated. From the simulation results, as the substrate temperature and/or incident energy is increased, the surface roughness of the grown film could be reduced, and the interface intermixing is increased. Also, as compared to Co–Cu system, Fe–Cu system has better surface roughness, less interface intermixing, and similar radial distribution function as well as average stresses.
  • Keywords
    Ionized cluster beam deposition , Atomic stress , Surface roughness , Tight-binding potential , Molecular dynamic
  • Journal title
    Surface Science
  • Serial Year
    2011
  • Journal title
    Surface Science
  • Record number

    1685931