Title of article
X-ray scattering study of interfacial roughness in Nb/PdNi multilayers
Author/Authors
Vecchione، نويسنده , , A. and Fittipaldi، نويسنده , , R. and Cirillo، نويسنده , , C. and Hesselberth، نويسنده , , M. and Aarts، نويسنده , , J. and Prischepa، نويسنده , , S.L. and Kushnir، نويسنده , , V.N. and Kupriyanov، نويسنده , , M.Yu. and Attanasio، نويسنده , , C.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2011
Pages
6
From page
1791
To page
1796
Abstract
Specular and diffuse X-ray scattering are used to study interfacial roughness in Nb/Pd0.81Ni0.19 multilayers deposited by dc UHV sputtering. The data are analyzed to extract information about the correlated behavior of interface roughness in both the lateral and vertical directions. X-ray reflectivity is treated quantitatively by computer-aided simulation and modelling in order to extract values also for the layers thickness. From the analysis of the diffusive spectra of the reflectivity maps the roughness correlation has been evaluated.
Keywords
Interfacial roughness , Metallic multilayers , Diffuse X-ray scattering , X-ray reflectivity , Correlated roughness , Specular X-ray scattering , Superconductivity , Ferromagnetism
Journal title
Surface Science
Serial Year
2011
Journal title
Surface Science
Record number
1686186
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