Title of article
Moiré pattern in LEED obtained by van der Waals epitaxy of lattice mismatched WS2/MoTe2(0001) heterointerfaces
Author/Authors
Tiefenbacher، نويسنده , , S. and Pettenkofer، نويسنده , , C. and Jaegermann، نويسنده , , W.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2000
Pages
10
From page
181
To page
190
Abstract
Thin films of WS2 have been grown by van der Waals epitaxy (vdWE) on the basal planes of 2H-MoTe2(0001). Despite a lateral mismatch of 10.3%, epitaxial growth is achieved by metal organic vdWE (MOvdWE). In low energy electron diffraction (LEED) measurements a Moiré-like superstructure is observed originating from and correlated to the lateral mismatch between film and substrate. I–V LEED investigations in the course of sequential film growth reveal an undulation of the lattice at the interfaces as the origin of the Moiré-like structure rather than simple multiple scattering between overlayer and substrate.
Keywords
Bending of surfaces , epitaxy , Molybdenum , Semiconductor–semiconductor heterostructures , Tungsten , Low energy electron diffraction (LEED)
Journal title
Surface Science
Serial Year
2000
Journal title
Surface Science
Record number
1687702
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