• Title of article

    An XPS study of the influence of impurity Cu on the electronic structure of SrS

  • Author/Authors

    Vdovenkova، نويسنده , , T. and Vdovenkov، نويسنده , , A. and Soininen، نويسنده , , E.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2000
  • Pages
    5
  • From page
    529
  • To page
    533
  • Abstract
    In this work the influence of Cu on X-ray photoelectron Sr 3d and S 2p spectra for low Cu concentrations in SrS is studied. The Cu impurity in the SrS lattice is detected by SIMS and X-ray diffractometry. l analysis of the S 2p and Sr 3d spectra shows that the Cu impurity at concentrations less than the XPS sensitivity limit has its main influence on the S 2p doublets that correspond to sulphur in SrS and to elementary sulphur clusters. SrS doping by Cu with subsequent annealing is accompanied by a decrease in the sulphur clusters size and leads to downward band bending and/or n-doping of SrS.
  • Keywords
    Copper , Semiconducting films , Sulphur , X-ray photoelectron spectroscopy , Alkaline earth metals
  • Journal title
    Surface Science
  • Serial Year
    2000
  • Journal title
    Surface Science
  • Record number

    1688162