Title of article
(0 0 1) V surface structures analysed by RHEED and STM
Author/Authors
Dulot، نويسنده , , F. and Turban، نويسنده , , P. and Kierren، نويسنده , , B. and Eugène، نويسنده , , J. and Alnot، نويسنده , , M. and Andrieu، نويسنده , , S.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
11
From page
172
To page
182
Abstract
In this paper, the single-crystalline (0 0 1) V surface is studied by electron diffraction, Auger spectroscopy, and scanning tunnelling microscopy (STM). (1×1), (5×5) (and sometimes 6×6) surface atomic arrangement are observed in correlation with the oxygen surface concentration. For less than 0.15 ml of oxygen, no reconstruction is detected. The (5×5) surface structure is observed for an oxygen coverage in the range 0.15–1.2 ml. However, a pseudo-(1×1) surface structure can also be observed near 1 ml of oxygen. The STM analysis demonstrates that the (5×5) reconstruction results in fact from a mixing of (5×1) and (1×5) domains. At the atomic scale, the images show that the electronic density is modified over two parallel atomic lines every five but also six atomic distances. For the pseudo-(1×1) reconstructed surface, these lines are still present, but, depending on the density of vacancies, (6×1) up to (12×1) periodicities can be observed locally. We find that the periodicity linearly increases with the number of vacancies. The extension of this linear dependence up to the lack of vacancies leads to the (5×1) periodicity. These surface reconstructions lead to unusual reflection high-energy electron diffraction (RHEED) patterns, that are perfectly explained by the surface morphology. Finally, RHEED measurement of the in-plane lattice parameter allows us to demonstrate that the (5×5) reconstructed surface is compressed. This behaviour allows us to propose a model for the (0 0 1) V surface reconstructions induced by oxygen.
Keywords
Scanning tunnelling microscopy , Auger electron spectroscopy , vanadium , Surface relaxation and reconstruction , Reflection high-energy electron diffraction (RHEED)
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1689116
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