• Title of article

    Scanning tunneling microscopy observation of Bi-induced surface structures on the Si(1 0 0) surface

  • Author/Authors

    Naitoh، نويسنده , , M. and Takei، نويسنده , , M. and Nishigaki، نويسنده , , S. and Oishi، نويسنده , , N. and Shoji، نويسنده , , F.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2001
  • Pages
    5
  • From page
    1440
  • To page
    1444
  • Abstract
    Formation of new surface structures induced by bismuth adsorbates at the Si(1 0 0) surface has been investigated by scanning tunneling microscopy. Bismuth atoms that adsorbed on the surface at 500°C, form long linear belts in the Si(1 0 0) topmost layer. Each belt consists of two chains of bismuth dimers and substitutes for four Si-dimers per Si-dimer row in the terrace. At higher coverages of bismuth (∼3 ML) at 450°C, long linear structures with an arrangement of bismuth chains similar to the belt on the Si terraces are formed in the bismuth terraces. When bismuth was deposited on the clean Si(1 0 0) surface at room temperature and the surface was sequentially annealed, deep pits were constructed in bismuth-covered terraces. This result is attributed to the strain in the bismuth films.
  • Keywords
    Low index single crystal surfaces , Bismuth , surface structure , Scanning tunneling microscopy , morphology , and topography , Surface stress , Roughness , Surface relaxation and reconstruction , Silicon
  • Journal title
    Surface Science
  • Serial Year
    2001
  • Journal title
    Surface Science
  • Record number

    1690397