Title of article
Scanning tunneling microscopy observation of Bi-induced surface structures on the Si(1 0 0) surface
Author/Authors
Naitoh، نويسنده , , M. and Takei، نويسنده , , M. and Nishigaki، نويسنده , , S. and Oishi، نويسنده , , N. and Shoji، نويسنده , , F.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
5
From page
1440
To page
1444
Abstract
Formation of new surface structures induced by bismuth adsorbates at the Si(1 0 0) surface has been investigated by scanning tunneling microscopy. Bismuth atoms that adsorbed on the surface at 500°C, form long linear belts in the Si(1 0 0) topmost layer. Each belt consists of two chains of bismuth dimers and substitutes for four Si-dimers per Si-dimer row in the terrace. At higher coverages of bismuth (∼3 ML) at 450°C, long linear structures with an arrangement of bismuth chains similar to the belt on the Si terraces are formed in the bismuth terraces. When bismuth was deposited on the clean Si(1 0 0) surface at room temperature and the surface was sequentially annealed, deep pits were constructed in bismuth-covered terraces. This result is attributed to the strain in the bismuth films.
Keywords
Low index single crystal surfaces , Bismuth , surface structure , Scanning tunneling microscopy , morphology , and topography , Surface stress , Roughness , Surface relaxation and reconstruction , Silicon
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1690397
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