Title of article
Single- and triple-height-step distributions on Si(1 1 1) vicinal surfaces inclined toward [1̄ 1̄ 2] studied by reflection electron microscopy
Author/Authors
Suzuki، نويسنده , , T and Minoda، نويسنده , , H and Tanishiro، نويسنده , , Y and Yagi، نويسنده , , K، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2002
Pages
8
From page
179
To page
186
Abstract
Equilibrium distributions of single- and triple-height steps (Ss and Ts) were studied on Si(1 1 1) vicinal surfaces inclined toward [1̄ 1̄ 2] by angles between 0° and 10.5°. The Ts formed at off-angles θ larger than about 1.5°. The Ts coexisted with the Ss at 1.5°<θ<5°. However, the surface did not have a hill and valley structure composed of areas with only Ss or Ts. At θ=5° long annealing transformed most of the Ss into Ts, so that the sparse Ss could not exist side by side. Two surface phases with regularly arranged Ts of distinct spacings of 11 and 9 nm formed at θ=5° and 6°, respectively. A hill and valley structure composed of the two surface phases formed at 5°<θ<6°. Another hill and valley structure composed of the narrowly spaced surface phase (9 nm) and a surface with Miller indices (h h m) (h/m=1.4–1.5) formed at 6°<θ<10.5°. The (h h m) structure covered most of surface at θ=10.5°.
Keywords
Vicinal single crystal surfaces , High index single crystal surfaces , Silicon , Reflection electron microscopy (REM)
Journal title
Surface Science
Serial Year
2002
Journal title
Surface Science
Record number
1690647
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