• Title of article

    Second layer rumpling in Ni(1 1 0)c(2×2)–S

  • Author/Authors

    Woodhead، نويسنده , , A.P and Bailey، نويسنده , , P and Noakes، نويسنده , , T.C.Q and Norman، نويسنده , , D and Thornton، نويسنده , , G، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2002
  • Pages
    8
  • From page
    299
  • To page
    306
  • Abstract
    Medium energy ion scattering (MEIS) using 100 keV H+ ions has been used to study the structure of Ni(1 1 0)c(2×2)–S. Blocking curves in two of the three principal azimuths have been measured in order to determine the atomic positions in both the surface and sub-surface layers. The MEIS data indicate that S lies 0.90±0.06 Å above the plane of the first layer Ni. The average distance of 1.39±0.04 Å found for the first to second nickel layer spacing corresponds to an expansion of 12% when compared to the bulk layer spacing and we find a rumpling of 0.18±0.07 Å in the second layer. The polarity of rumpling is such that Ni atoms capped by S lie closer to the surface.
  • Keywords
    nickel , Sulphur , Medium energy ion scattering (MEIS) , Surface relaxation and reconstruction , Nickel sulphide
  • Journal title
    Surface Science
  • Serial Year
    2002
  • Journal title
    Surface Science
  • Record number

    1690669