Title of article
Element-selective mapping of magnetic moments in ultrathin magnetic films using a photoemission microscope
Author/Authors
Kuch، نويسنده , , W. and Gilles، نويسنده , , J. and Offi، نويسنده , , F. and Kang، نويسنده , , S.S. and Imada، نويسنده , , S. and Suga، نويسنده , , S. and Kirschner، نويسنده , , J.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
10
From page
153
To page
162
Abstract
We combine X-ray magnetic circular dichroism (XMCD) and photoelectron emission microscopy to obtain locally resolved magnetic information on a microscopic scale. Scanning the photon energy across elemental absorption edges and recording microscopic images of the local secondary electron intensity for both photon helicities at each photon energy step allows to analyze local XMCD spectra at any position of the imaged area of the sample. With the help of magnetic sum-rules local quantitative information about magnetic moments can be extracted from such microspectroscopic measurements. The full power of XMCD as a spectroscopic tool is so maintained, while microscopic spatial resolution is added.
Keywords
Photoemission (total yield) , Photoelectron emission , Iron , X-ray absorption spectroscopy , nickel , Magnetic films
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1690840
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