Title of article
Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter
Author/Authors
Merkel، نويسنده , , M and Escher، نويسنده , , M and Settemeyer، نويسنده , , D. Funnemann، نويسنده , , D and Oelsner، نويسنده , , A and Ziethen، نويسنده , , Ch and Schmidt، نويسنده , , O and Klais، نويسنده , , M and Schِnhense، نويسنده , , G، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2001
Pages
7
From page
196
To page
202
Abstract
The use of an imaging retarding field analyser attached to the FOCUS IS-PEEM is described. This kind of energy filter is a simple, powerful tool to obtain microspectra from areas of down to about 1 μm using (V)UV and X-ray excitation sources. First results of microspectroscopy measured by excitation with a laboratory as well as a synchrotron X-ray source are presented.
Keywords
Electron microscopy , Photoelectron spectroscopy
Journal title
Surface Science
Serial Year
2001
Journal title
Surface Science
Record number
1690861
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