Photoelectron diffraction study on Ge(1 0 0) 3d core level

The 3d core level of Ge(1 0 0)-c(4×2) surface has been measured by high resolution photoemission at l00 K. The line shape presents several features. The analysis of the Ge 3d core levels unambiguously reveals for the first time the presence of four surface components analogous to the surface components in Si(1 0 0)-c(4×2) 2p core level. In order to associate the surface core level components to their corresponding atomic sites we have performed azimuthal Ge 3d core level photoelectron diffraction on the Ge(1 0 0) surface at low kinetic energy. The comparison with multiple scattering calculations is shown.