Title of article
X-ray characterization of as-deposited, epitaxial films of Bi(0 1 2) on Au(1 1 1)
Author/Authors
Jeffrey ، نويسنده , , Craig A. and Zheng، نويسنده , , Susan H. and Bohannan، نويسنده , , Eric and Harrington، نويسنده , , David A. and Morin، نويسنده , , Sylvie، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2006
Pages
11
From page
95
To page
105
Abstract
Electrodeposition is used to produce epitaxial single-crystal films on Au(1 1 1) substrates without annealing or other post-deposition modification. X-ray techniques show that the Bi(0 1 2) plane is parallel to the underlying Au(1 1 1) surface, and the azimuthal orientation of the films is determined. Combination of the X-ray data with in situ scanning tunneling microscopy (STM) images suggests a common growth mode from the first few layers up to thick films.
Keywords
Electrodeposition , Scanning tunneling microscopy , surface structure , Bismuth , Film growth , epitaxy , X-ray methods
Journal title
Surface Science
Serial Year
2006
Journal title
Surface Science
Record number
1697451
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