• Title of article

    Curing monitoring of phenolic resol resins via atomic force microscope and contact angle

  • Author/Authors

    Lee، نويسنده , , Youngkyu and Kim، نويسنده , , Hyun-Joong and Rafailovich، نويسنده , , Miriam and Sokolov، نويسنده , , Jonathan، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    10
  • From page
    375
  • To page
    384
  • Abstract
    An atomic force microscope was used to investigate Si3N4 tip interactions with various curing conditions in three different molar ratios. Also the surface free energy and acid–base character of resol resin were investigated using contact angle analysis. The adhesion force between tip and surface can be calculated from the deflection distance of cantilever and the cantilever spring constant. The acid–base property of surface was characterized by calculating the work of acid–base interaction according to Fowkes’ and Good’s theory. And then, the adhesion force was compared to surface free energy. sult was that the hydrophobic effect also plays a significant role in adhesion force. At the same curing temperature the adhesion force for the more hydrophobic F/P=2.5 resol resin was comparatively lower than hydrophilic F/P=1.3 and 1.9 resin.
  • Keywords
    D.  , Cure/hardening , atomic force microscopy , C.  , Contact angle , C.  , A.  , phenolic
  • Journal title
    International Journal of Adhesion and Adhesives
  • Serial Year
    2002
  • Journal title
    International Journal of Adhesion and Adhesives
  • Record number

    1697794