The dynamics of He+ ion neutralization at a xenon film: Energy- and spin-resolved studies

The neutralization of He+ ions with energies in the range 10–500 eV at an adsorbed xenon layer is examined both by analyzing the energy distribution of electrons ejected from the surface and by use of spin-labeling techniques, specifically the use of electron-spin-polarized He+ ions coupled with measurement of the ejected electron polarization. The data indicate that neutralization proceeds via an Auger process similar to that which occurs at a clean high-work-function metal surface. At the higher ion energies, however, kinetic ejection becomes important and provides an increasing contribution to the total electron yield.