• Title of article

    Photoemission, NEXAFS and STM studies of pentacene thin films on Au(1 0 0)

  • Author/Authors

    McDonald، نويسنده , , O. and Cafolla، نويسنده , , A.A. and Carty، نويسنده , , D. and Sheerin، نويسنده , , G. and Hughes، نويسنده , , G.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2006
  • Pages
    9
  • From page
    3217
  • To page
    3225
  • Abstract
    We have investigated the initial stages of the growth of pentacene thin films on the Au(1 0 0) substrate using synchrotron radiation photoelectron spectroscopy (PES), near edge X-ray absorption fine structure (NEXAFS) and scanning tunnelling microscopy (STM). Results indicate a well-ordered structure with the pentacene molecules adopting a predominantly flat orientation with respect to the substrate for coverages of less than three monolayers. NEXAFS and photoemission data indicates the presence of a second molecular orientation for thicker films, with the introduction of a slight tilting away from planar bonding geometry at higher pentacene coverages. STM images of coverages less than three monolayers indicate a well-ordered pentacene structure allowing for the calculation of pentacene unit cell parameters. The pentacene molecular rows adopt a side-by-side bonding arrangement on the surface. For pentacene deposited at room temperature, step edges were observed to act as nucleation centres for film growth. Annealing of the substrate to 373 K was found to remove excess molecules and improve film quality, but did not otherwise change the bonding geometry of the pentacene with respect to the surface.
  • Keywords
    Soft X-ray photoelectron spectroscopy , Scanning tunneling microscopy , workfunction , Metal–organic interface , Interface dipole , pentacene , Near edge extended X-ray absorption fine structure (NEXAFS)
  • Journal title
    Surface Science
  • Serial Year
    2006
  • Journal title
    Surface Science
  • Record number

    1698796