Title of article
MnxGe1−x thin layers studied by TEM, X-ray absorption spectroscopy and SQUID magnetometry
Author/Authors
De Padova، نويسنده , , P. and Ayoub، نويسنده , , J.-P. and Berbezier، نويسنده , , I. and Mariot، نويسنده , , J.-M. and Taleb-Ibrahimi، نويسنده , , A. and Richter، نويسنده , , M.C. and Heckmann، نويسنده , , O. and Testa، نويسنده , , A.M. and Fiorani، نويسنده , , D. and Olivieri، نويسنده , , B. and Picozzi، نويسنده , , S. and Hricovini، نويسنده , , K.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2007
Pages
4
From page
2628
To page
2631
Abstract
Mn0.06Ge0.94 samples have been grown by molecular-beam epitaxy on Ge(0 0 1)2 × 1. High-resolution transmission electron microscopy shows the coexistence of an ordered diluted Mn0.06Ge0.94 film and of nanoscopic crystallites, which were identified as Mn5Ge3 by electron diffraction. The magnetic properties of the Mn0.06Ge0.94 samples show a superposition of a paramagnetic behavior, due to the interaction of Mn atoms diluted in the Ge host, and a ferromagnetic behavior attributed to the Mn5Ge3 crystallites dispersed into the films. The Mn L2,3 X-ray absorption spectra of the Mn0.06Ge0.94 films exhibit a lineshape typical of metallic Mn, with considerably reduced multiplet structure.
Keywords
Magnetic measurements , Metal–semiconductor interfaces , Manganese , Germanium , Electron microscopy , Electron–solid diffraction , X-ray absorption spectroscopy , Soft X-ray photoelectron spectroscopy
Journal title
Surface Science
Serial Year
2007
Journal title
Surface Science
Record number
1700958
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