Characterization of Au nano-cluster formation on and diffusion in polystyrene using XPS peak shape analysis

XPS peak shape analysis is used as a novel and nondestructive method to study Au nano-cluster growth mechanism on polystyrene (PS) as a function of deposition as well as diffusion and distribution of the nano-clusters in PS as a function of subsequent annealing at temperatures in the range from room temperature to above the glass transition temperature of PS. The Au nano-cluster size and density are determined for four different amounts of Au deposition. It is shown that this nondestructive method can give all mentioned information on such a metalized polymer without the need for any other complimentary and time consuming technique such as AFM, TEM and the destructive technique XTEM. Thus this method is suitable to monitor and control the degree of intermixing of metal nano-clusters and polymers which is of high technological interest.