Title of article
Electrical circuit modeling of surface structures for X-ray photoelectron spectroscopic measurements
Author/Authors
Tasci، نويسنده , , T. Onur and Atalar، نويسنده , , Ergin and Demirok، نويسنده , , U. Korcan and Suzer، نويسنده , , Sefik، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2008
Pages
4
From page
365
To page
368
Abstract
We model the X-ray photoelectron spectrometer and the sample with lumped electrical circuit elements, and simulate various types of conditions using a widely used computer program (PSpice) and compare the results with experimental measurements. By using the electrical model simulations, the surface voltage and the spectrum can be estimated under various types of external voltage stimuli, and the zero potential condition can be predicted accurately for obtaining a truly uncharged spectrum. Additionally, effects of several charging mechanisms (taking place during XPS measurements) on the surface potential could easily be assessed. Finally, the model enables us to find electrical properties, like resistance and capacitance of surface structures, under X-ray and low-energy electron exposure.
Keywords
Modeling and simulation , Differential charging , X-ray photoelectron spectroscopy , Silicon dioxide layers , Resistance and capacitance
Journal title
Surface Science
Serial Year
2008
Journal title
Surface Science
Record number
1702697
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