• Title of article

    Surface structure of nickel oxide layers on a Rh(111) surface

  • Author/Authors

    G. and Gragnaniello، نويسنده , , L. I. Allegretti، نويسنده , , F. Benjamin Zhan، نويسنده , , R.R. and Vesselli، نويسنده , , E. and Baraldi، نويسنده , , A. and Comelli، نويسنده , , G. and Surnev، نويسنده , , S. and Netzer، نويسنده , , F.P.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2013
  • Pages
    8
  • From page
    86
  • To page
    93
  • Abstract
    The formation of nickel oxide nanolayers by oxidizing Ni overlayers on Rh(111) has been investigated and their structures are reported as a function of the nickel coverage and oxygen pressure. Scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), X-ray photoelectron spectroscopy (XPS) and diffraction (XPD), and high-resolution electron energy loss spectroscopy (HREELS) have been applied to characterize the structure and stoichiometry of the nickel oxide nanolayers. Several different phases have been observed depending on the strain state of the metallic Ni overlayers. For the pseudomorphic Ni monolayer, two distinctly different oxide phases with (6 × 1)-Ni5O5 and (2√3 × 2)-Ni8O10 structures have been identified at oxygen-poor (p = 5 × 10− 8 mbar) and oxygen-rich (p ≥ 1 × 10− 6 mbar) conditions, respectively. Above one monolayer, where the Ni layers are relaxed, bulk-like NiO(100) films form at the O-rich conditions, whereas chemisorbed-type p(2 × 2)ONi(111) layers develop in the O-poor regime. X-ray photoelectron diffraction analysis has provided additional insight into the relaxation mechanism and the detailed atomic structure of the Ni-oxide nanolayers.
  • Keywords
    Rh(111) , Nickel oxide , STM , XPD
  • Journal title
    Surface Science
  • Serial Year
    2013
  • Journal title
    Surface Science
  • Record number

    1705774