Title of article
Stress-induced diffusion and defect chemistry of La0.2Sr0.8Fe0.8Cr0.2O3−δ: 2. Structural, elemental and chemical analysis
Author/Authors
G. Majkic، نويسنده , , G. and Mironova، نويسنده , , M. and Wheeler، نويسنده , , L.T and Salama، نويسنده , , K.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2004
Pages
12
From page
243
To page
254
Abstract
A set of La0.2Sr0.8Fe0.8Cr0.2O3−δ samples was quenched from 1100 °C and pO2 of 0.21, 5.0×10−10 and 1.7×10−13 atm. In addition to this pressureless quench, one sample was rapidly cooled from 1100 °C and 8×10−14 atm while subjected to compressive stress of 30 MPa. The samples are studied by a range of structural, elemental and chemical analysis techniques, as well as microscopy. In addition, the material is subjected to isothermal thermogravimetric and electrical conductivity measurements as a function of oxygen partial pressure. These results are analyzed in view of obtaining more information about the mechanisms responsible for the creep behavior of this compound in controlled oxygen atmosphere.
Keywords
quench , SIMS , defect chemistry , diffusion creep , Perovskite
Journal title
Solid State Ionics
Serial Year
2004
Journal title
Solid State Ionics
Record number
1715886
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