• Title of article

    26Al tracer diffusion in titanium doped single crystalline α-Al2O3

  • Author/Authors

    Fielitz، نويسنده , , P. H. Borchardt and N. V. Richardson، نويسنده , , G. and Ganschow، نويسنده , , S. and Bertram، نويسنده , , R. and Markwitz، نويسنده , , A.، نويسنده ,

  • Issue Information
    هفته نامه با شماره پیاپی سال 2008
  • Pages
    7
  • From page
    373
  • To page
    379
  • Abstract
    Simultaneous 18O and 26Al tracer diffusion experiments were performed on titanium doped single crystalline α-Al2O3. The simultaneous tracer diffusion of 18O and 26Al clearly demonstrates that the aluminium diffusivity in Ti doped alumina is orders of magnitude higher than the oxygen diffusivity. The enhanced aluminium diffusivity is caused by an increase of the concentration of mobile Al vacancies. The reasonably good agreement between earlier conductivity measurements and our transport measurements indicates in accordance with theoretical work that the migration enthalpy of aluminium vacancies is (3.8 ± 0.1) eV.
  • Keywords
    Al2O3 , alumina , Titanium doped , Aluminium diffusion , 26Al , SIMS
  • Journal title
    Solid State Ionics
  • Serial Year
    2008
  • Journal title
    Solid State Ionics
  • Record number

    1720447