Title of article
26Al tracer diffusion in titanium doped single crystalline α-Al2O3
Author/Authors
Fielitz، نويسنده , , P. H. Borchardt and N. V. Richardson، نويسنده , , G. and Ganschow، نويسنده , , S. and Bertram، نويسنده , , R. and Markwitz، نويسنده , , A.، نويسنده ,
Issue Information
هفته نامه با شماره پیاپی سال 2008
Pages
7
From page
373
To page
379
Abstract
Simultaneous 18O and 26Al tracer diffusion experiments were performed on titanium doped single crystalline α-Al2O3. The simultaneous tracer diffusion of 18O and 26Al clearly demonstrates that the aluminium diffusivity in Ti doped alumina is orders of magnitude higher than the oxygen diffusivity. The enhanced aluminium diffusivity is caused by an increase of the concentration of mobile Al vacancies. The reasonably good agreement between earlier conductivity measurements and our transport measurements indicates in accordance with theoretical work that the migration enthalpy of aluminium vacancies is (3.8 ± 0.1) eV.
Keywords
Al2O3 , alumina , Titanium doped , Aluminium diffusion , 26Al , SIMS
Journal title
Solid State Ionics
Serial Year
2008
Journal title
Solid State Ionics
Record number
1720447
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