Title of article
Temperature dependence of exciton Auger decay process in cuprous oxide
Author/Authors
Liu، نويسنده , , Yingmei and Snoke، نويسنده , , David، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
6
From page
208
To page
213
Abstract
We report a theoretical and experimental study on Auger decay of excitons in Cu2O at a wide range of temperatures, from 2 to 325 K, in single-photon surface excitation. We find that the Auger constant linearly increases with temperature above 100 K. This constant is important for experiments on Bose condensation of excitons.
Keywords
A. Excitons , D. Auger recombination , D. Density-dependent recombination , E. Bose–Einstein condensation
Journal title
Solid State Communications
Serial Year
2006
Journal title
Solid State Communications
Record number
1763523
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