Title of article
Structure-independent universality of Barkhausen criticality in iron nitride thin films
Author/Authors
Atiq، نويسنده , , Shahid S. Siddiqi، نويسنده , , Saadat Anwar and Lee، نويسنده , , Hun-Sung and Anwar، نويسنده , , M. Sabieh and Shin، نويسنده , , Sung-Chul، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
4
From page
1169
To page
1172
Abstract
Discrete and jerky jumps during the process of magnetization reversal in ferromagnetic systems cause Barkhausen intermittency. We have investigated critical scaling behavior of the Barkhausen avalanche of 2-dimensional γ-Fe4N thin films using a magneto-optic microscope magnetometer (MOMM) capable of time-resolved magnetic domain images. A statistical analysis of the fluctuating size of Barkhausen jumps from numerous repetitive experiments shows a power-law scaling behavior in the ferromagnetic iron nitride system exhibiting a critical exponent value of τ = 1.02 within the experimental error. The value of critical exponent is found to manifest universality irrespective of the degree of texture of the film induced by annealing temperature.
Keywords
B. Epitaxy , A. Thin films
Journal title
Solid State Communications
Serial Year
2010
Journal title
Solid State Communications
Record number
1766878
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