• Title of article

    Structure-independent universality of Barkhausen criticality in iron nitride thin films

  • Author/Authors

    Atiq، نويسنده , , Shahid S. Siddiqi، نويسنده , , Saadat Anwar and Lee، نويسنده , , Hun-Sung and Anwar، نويسنده , , M. Sabieh and Shin، نويسنده , , Sung-Chul، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    4
  • From page
    1169
  • To page
    1172
  • Abstract
    Discrete and jerky jumps during the process of magnetization reversal in ferromagnetic systems cause Barkhausen intermittency. We have investigated critical scaling behavior of the Barkhausen avalanche of 2-dimensional γ-Fe4N thin films using a magneto-optic microscope magnetometer (MOMM) capable of time-resolved magnetic domain images. A statistical analysis of the fluctuating size of Barkhausen jumps from numerous repetitive experiments shows a power-law scaling behavior in the ferromagnetic iron nitride system exhibiting a critical exponent value of τ = 1.02 within the experimental error. The value of critical exponent is found to manifest universality irrespective of the degree of texture of the film induced by annealing temperature.
  • Keywords
    B. Epitaxy , A. Thin films
  • Journal title
    Solid State Communications
  • Serial Year
    2010
  • Journal title
    Solid State Communications
  • Record number

    1766878