Photoelectron spectromicroscopy of electrochemically induced oxygen spillover at the Pt/YSZ interface

Scanning photoelectron microscopy (SPEM) has been applied to study the processes at the interface between the oxygen ion conducting solid electrolyte YSZ (yttrium stabilized zirconia) and a microstructured 500 إ thick Pt film on top of the YSZ when electrical potentials are applied. An electrochemically induced oxygen spillover onto the Pt surface has been observed upon electrochemical pumping with a positive potential applied to the Pt film. The spillover species was characterized in X-ray photoelectron spectroscopy by an O 1s binding energy of 530.4 eV which is identical to that of chemisorbed oxygen from the gas phase.