• Title of article

    Electronic transport properties of coupled single-electron transistors

  • Author/Authors

    Shin، نويسنده , , M. and Lee، نويسنده , , S. and Park، نويسنده , , K.W. and Kim، نويسنده , , G.-H.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    527
  • To page
    532
  • Abstract
    The electronic transport properties of parallel coupled single-electron transistors (SETs) at strong coupling under asymmetrical voltage bias are investigated theoretically. The binding of electrons and holes on the two islands of the coupled SETs is found to be the key element that governs the transport characteristics. The discrete nature of bound electrons and holes leads to the satellite Coulomb blockade oscillations, the current jumps, and the Coulomb staircases, all of which are distinct transport features of the coupled SETs.
  • Keywords
    A. Nanostructures , B. Electronic transport , C. Tunneling
  • Journal title
    Solid State Communications
  • Serial Year
    2000
  • Journal title
    Solid State Communications
  • Record number

    1786221