Title of article
X-ray diffraction study of pressure-induced amorphization in Lu2(WO4)3
Author/Authors
Liu، نويسنده , , H. and Secco، نويسنده , , R.A. and Imanaka، نويسنده , , Noriko N. and Adachi، نويسنده , , G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
177
To page
180
Abstract
The effect of pressure on the crystal structure of Lu2(WO4)3 has been studied up to 8.0 GPa using X-ray powder diffraction. The recovered samples showed that the diffracted intensity decreases as the pressure increases. The first evidence of amorphization occurs at ∼5.0 GPa and total amorphization is completed at 8.0 GPa. The bending of Lu–O–W bonds and the tilting of polyhedra in the framework structure are suggested as the mechanism of amorphization. The correlation of pressure-induced amorphization in materials that have a negative thermal expansion coefficient is further supported by structural and thermal expansion behavior in Lu2(WO4)3.
Keywords
C. Crystal structure , E. High pressure , D. Other-pressure-induced amorphization
Journal title
Solid State Communications
Serial Year
2002
Journal title
Solid State Communications
Record number
1787141
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